Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    High-Reliability ONO Gate Dielectric for Power MOSFETs

    New search for: Tanimoto, S.
    New search for: Tanaka, H.
    New search for: Hayashi, T.
    New search for: Shimoida, Y.
    New search for: Hoshi, M.
    New search for: Mihara, T.
    New search for: Nipoti, R.
    New search for: Poggi, A.
    New search for: Scorzoni, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    High-Reliability ONO Gate Dielectric for Power MOSFETs

    New search for: Tanimoto, S.
    New search for: Tanaka, H.
    New search for: Hayashi, T.
    New search for: Shimoida, Y.
    New search for: Hoshi, M.
    New search for: Mihara, T.
    New search for: Nipoti, R.
    New search for: Poggi, A.
    New search for: Scorzoni, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High-Reliability ONO Gate Dielectric for Power MOSFETs

    New search for: Tanimoto, S.
    New search for: Tanaka, H.
    New search for: Hayashi, T.
    New search for: Shimoida, Y.
    New search for: Hoshi, M.
    New search for: Mihara, T.
    New search for: Nipoti, R.
    New search for: Poggi, A.
    New search for: Scorzoni, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    High-Reliability ONO Gate Dielectric for Power MOSFETs

    Contributors:

    Tanimoto, S. (author) / Tanaka, H. (author) / Hayashi, T. (author) / Shimoida, Y. (author) / Hoshi, M. (author) / Mihara, T. (author) / Nipoti, R. / Poggi, A. / Scorzoni, A.

    Published in:

    Silicon Carbide and Related Materials 2004 ; 677-680

    MATERIALS SCIENCE FORUM ; 483/485

    Publication date:

    2005-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    High-Temperature Reliability of SiC Power MOSFETs

    Lelis, A.J. / Green, R. / Habersat, D.B. | British Library Online Contents | 2011

    4H-SiC MOSFETs Using Thermal Oxidized Ta~2Si Films as High-k Gate Dielectric

    Perez-Tomas, A. / Godignon, P. / Mestres, N. et al. | British Library Online Contents | 2005

    A Study of High Temperature DC and AC Gate Stressing on the Performance and Reliability of Power SiC MOSFETs

    Green, R. / Lelis, A.J. / El, M. et al. | British Library Online Contents | 2013

    Performance and Reliability of SiC MOSFETs for High-Current Power Modules

    Matocha, K. / Losee, P.A. / Gowda, A. et al. | British Library Online Contents | 2010

    Critical Reliability Issues for SiC Power MOSFETs Operated at High Temperature

    Tanimoto, S. / Suzuki, T. / Hanamura, A. et al. | British Library Online Contents | 2007

    Back to top