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A Study of High Temperature DC and AC Gate Stressing on the Performance and Reliability of Power SiC MOSFETs
A Study of High Temperature DC and AC Gate Stressing on the Performance and Reliability of Power SiC MOSFETs
A Study of High Temperature DC and AC Gate Stressing on the Performance and Reliability of Power SiC MOSFETs
Green, R. (author) / Lelis, A.J. (author) / El, M. (author) / Habersat, D.B. (author) / Lebedev, A.A. / Davydov, S.Y. / Ivanov, P.A. / Levinshtein, M.E.
2013-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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