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Critical Reliability Issues for SiC Power MOSFETs Operated at High Temperature
Critical Reliability Issues for SiC Power MOSFETs Operated at High Temperature
Critical Reliability Issues for SiC Power MOSFETs Operated at High Temperature
Tanimoto, S. (author) / Suzuki, T. (author) / Hanamura, A. (author) / Hoshi, M. (author) / Shinohara, T. (author) / Arai, K. (author) / Wright, N. / Johnson, C. M. / Vassilevski, K. / Nikitina, I.
2007-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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