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    Characterization of structural films using microelectromechanical resonators

    New search for: MUHLSTEIN, C. L.

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    Characterization of structural films using microelectromechanical resonators

    New search for: MUHLSTEIN, C. L.

    Access

    Access via TIB
    Check availability in my library
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    Characterization of structural films using microelectromechanical resonators

    New search for: MUHLSTEIN, C. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Characterization of structural films using microelectromechanical resonators

    Contributors:

    MUHLSTEIN, C. L. (author)

    Published in:

    FATIGUE AND FRACTURE OF ENGINEERING MATERIALS AND STRUCTURES ; 28 ; 711-721

    Publication date:

    2005-01-01

    Size:

    11 pages

    ISSN:

    8756-758X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1123

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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