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Residual stress and structure characteristics in PZT ferroelectric thin films annealed at different ramp rates
Residual stress and structure characteristics in PZT ferroelectric thin films annealed at different ramp rates
Residual stress and structure characteristics in PZT ferroelectric thin films annealed at different ramp rates
MATERIALS LETTERS ; 60 ; 255-260
2006-01-01
6 pages
Article (Journal)
English
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