Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Thickness Effect on Microstructure and Residual Stress of Annealed Copper Thin Films

    New search for: Vayrette, R.
    New search for: Rivero, C.
    New search for: Blayac, S.
    New search for: Inal, K.
    New search for: Scardi, P.
    New search for: Ricardo, C.L.A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Thickness Effect on Microstructure and Residual Stress of Annealed Copper Thin Films

    New search for: Vayrette, R.
    New search for: Rivero, C.
    New search for: Blayac, S.
    New search for: Inal, K.
    New search for: Scardi, P.
    New search for: Ricardo, C.L.A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thickness Effect on Microstructure and Residual Stress of Annealed Copper Thin Films

    New search for: Vayrette, R.
    New search for: Rivero, C.
    New search for: Blayac, S.
    New search for: Inal, K.
    New search for: Scardi, P.
    New search for: Ricardo, C.L.A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Thickness Effect on Microstructure and Residual Stress of Annealed Copper Thin Films

    Contributors:

    Vayrette, R. (author) / Rivero, C. (author) / Blayac, S. (author) / Inal, K. (author) / Scardi, P. / Ricardo, C.L.A.

    Published in:

    Residual Stresses VIII ; 139-144

    MATERIALS SCIENCE FORUM ; 681

    Publication date:

    2011-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Residual stress and microstructure of as-deposited and annealed, sputtered yttria-stabilized zirconia thin films

    Quinn, D.J. / Wardle, B. / Spearing, S.M. | British Library Online Contents | 2008

    Phase Structure and Residual Stress in Annealed Cu-W Films

    Yuan, W. / Xiaohua, L. / Zhongxiao, S. | British Library Online Contents | 2007

    Residual Stress Relaxation and Microstructure in ZnO Thin Films

    Ozen, I. / Gulgun, M.A. | British Library Conference Proceedings | 2006

    Residual Stress Relaxation and Microstructure in ZnO Thin Films

    Ozen, I. / Gulgun, M. A. | British Library Conference Proceedings | 2006

    Residual stress and structure characteristics in PZT ferroelectric thin films annealed at different ramp rates

    Lu, S. / Zuo, C. / Zeng, H. et al. | British Library Online Contents | 2006

    Back to top