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    Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing

    New search for: Ristic, G. S.
    New search for: Pejovic, M. M.
    New search for: Jaksic, A. B.

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    Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing

    New search for: Ristic, G. S.
    New search for: Pejovic, M. M.
    New search for: Jaksic, A. B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing

    New search for: Ristic, G. S.
    New search for: Pejovic, M. M.
    New search for: Jaksic, A. B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing

    Contributors:

    Ristic, G. S. (author) / Pejovic, M. M. (author) / Jaksic, A. B. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 3023-3032

    Publication date:

    2006-01-01

    Size:

    10 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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