Comparison between post-irradiation annealing and post-high electric field stress annealing of n-channel power VDMOSFETs

Ristic, G. S. / Pejovic, M. M. / Jaksic, A. B. | British Library Online Contents | 2003

Formation and passivation of interface traps in irradiated n-channel power VDMOSFETs during thermal annealing

Pejovic, M. / Ristic, G. / Jaksic, A. | British Library Online Contents | 1997

Calibration of Mobility and Interface Trap Parameters for High Temperature TCAD Simulation of 4H-SiC VDMOSFETs

Jaikumar, M.G. / Karmalkar, S. | British Library Online Contents | 2012

Thermal stability and surface behaviors of CeO2/Si films during in-situ vacuum annealing

Luo, L. / Chen, J. / Wang, X. | British Library Online Contents | 2014

Post neutron irradiation annealing and defect evolution in single crystal tungsten

D. Papadakis / K. Mergia / E. Manios et al. | DOAJ | 2023