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Structural investigation of Ge-Sb-Sn thin films using transmission electron microscopy

Naito, M. / Ishimaru, M. / Hirotsu, Y. / Takashima, M. / Matsumoto, H.

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Structural investigation of Ge-Sb-Sn thin films using transmission electron microscopy

Naito, M. / Ishimaru, M. / Hirotsu, Y. / Takashima, M. / Matsumoto, H.

Structural investigation of Ge-Sb-Sn thin films using transmission electron microscopy

Naito, M. / Ishimaru, M. / Hirotsu, Y. / Takashima, M. / Matsumoto, H.

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Document information

Title:

Structural investigation of Ge-Sb-Sn thin films using transmission electron microscopy

Contributors:

Naito, M. (author) / Ishimaru, M. (author) / Hirotsu, Y. (author) / Takashima, M. (author) / Matsumoto, H. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 41 ; 2615-2619

Publication date:

2006-01-01

Size:

5 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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