Carrier Generation Lifetime in 4H-SiC Epitaxial Wafers: Fid-Bau Portal

Carrier Generation Lifetime in 4H-SiC Epitaxial Wafers

Chung, G.Y. / Loboda, M.J. / Marninella, M.J. / Schroder, D.K. / Isaacs-Smith, T. / Williams, J.R.

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Carrier Generation Lifetime in 4H-SiC Epitaxial Wafers

Chung, G.Y. / Loboda, M.J. / Marninella, M.J. / Schroder, D.K. / Isaacs-Smith, T. / Williams, J.R.

Carrier Generation Lifetime in 4H-SiC Epitaxial Wafers

Chung, G.Y. / Loboda, M.J. / Marninella, M.J. / Schroder, D.K. / Isaacs-Smith, T. / Williams, J.R.

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Document information

Title:

Carrier Generation Lifetime in 4H-SiC Epitaxial Wafers

Contributors:

Chung, G.Y. (author) / Loboda, M.J. (author) / Marninella, M.J. (author) / Schroder, D.K. (author) / Isaacs-Smith, T. (author) / Williams, J.R. (author)

Published in:

MATERIALS SCIENCE FORUM ; 615/617 ; 283-286

Publication date:

2009-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Chung, G.Y. / Loboda, M.J. / MacMillan, M.F. et al. | British Library Online Contents | 2009

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Carrier Lifetime Analysis by Microwave Photoconductive Decay (mu-PCD) for 4H SiC Epitaxial Wafers

Chung, G. Y. / Loboda, M. J. / MacMillan, M. F. et al. | British Library Online Contents | 2007

Minority carrier lifetime and metallic-impurity mapping in silicon wafers

Palais, O. / Martinuzzi, S. / Simon, J. J. | British Library Online Contents | 2001

Mapping of minority carrier lifetime and mobility in imperfect silicon wafers

Palais, O. / Clerc, L. / Arcari, A. et al. | British Library Online Contents | 2003