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    Different optical conductivity enhancement (OCE) protocols to eliminate charging during ultra low energy SIMS profiling of semiconductor and semi-insulating materials

    New search for: Morris, R. J.
    New search for: Dowsett, M. G.
    New search for: Chang, R. J.

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    Different optical conductivity enhancement (OCE) protocols to eliminate charging during ultra low energy SIMS profiling of semiconductor and semi-insulating materials

    New search for: Morris, R. J.
    New search for: Dowsett, M. G.
    New search for: Chang, R. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Different optical conductivity enhancement (OCE) protocols to eliminate charging during ultra low energy SIMS profiling of semiconductor and semi-insulating materials

    New search for: Morris, R. J.
    New search for: Dowsett, M. G.
    New search for: Chang, R. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Different optical conductivity enhancement (OCE) protocols to eliminate charging during ultra low energy SIMS profiling of semiconductor and semi-insulating materials

    Contributors:

    Morris, R. J. (author) / Dowsett, M. G. (author) / Chang, R. J. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 7221-7223

    Publication date:

    2006-01-01

    Size:

    3 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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