A platform for research: civil engineering, architecture and urbanism
Quantitative hydrogen measurements in PECVD and HWCVD a-Si:H using FTIR spectroscopy
Quantitative hydrogen measurements in PECVD and HWCVD a-Si:H using FTIR spectroscopy
Quantitative hydrogen measurements in PECVD and HWCVD a-Si:H using FTIR spectroscopy
Goldie, D. M. (author) / Persheyev, S. K. (author)
JOURNAL OF MATERIALS SCIENCE ; 41 ; 5287-5291
2006-01-01
5 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Controlling the c-Si/a-Si:H interface in silicon heterojunction solar cells fabricated by HWCVD
British Library Online Contents | 2017
|Mechanical stress reduction in PECVD a-Si:H thin films
British Library Online Contents | 1999
|mc-Si:H/c-Si solar cell prepared by PECVD
British Library Online Contents | 2006
|Nanostructural features of nc-Si:H thin films prepared by PECVD
British Library Online Contents | 2004
|Preparation of P-Type Microcrystal Si:H Films by ECR-PECVD
British Library Online Contents | 2011
|