Study of asymmetric charge writing on Pb(Zr,Ti)O3 thin films by Kelvin probe force microscopy: Fid-Bau Portal

Study of asymmetric charge writing on Pb(Zr,Ti)O3 thin films by Kelvin probe force microscopy

Shen, J. / Zeng, H. / Wang, Z. / Lu, S. / Huang, H. / Liu, J.

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Study of asymmetric charge writing on Pb(Zr,Ti)O3 thin films by Kelvin probe force microscopy

Shen, J. / Zeng, H. / Wang, Z. / Lu, S. / Huang, H. / Liu, J.

Study of asymmetric charge writing on Pb(Zr,Ti)O3 thin films by Kelvin probe force microscopy

Shen, J. / Zeng, H. / Wang, Z. / Lu, S. / Huang, H. / Liu, J.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Study of asymmetric charge writing on Pb(Zr,Ti)O3 thin films by Kelvin probe force microscopy

Contributors:

Shen, J. (author) / Zeng, H. (author) / Wang, Z. (author) / Lu, S. (author) / Huang, H. (author) / Liu, J. (author)

Published in:

APPLIED SURFACE SCIENCE ; 252 ; 8018-8021

Publication date:

2006-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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