Atomic force microscopy study of growth kinetics: Scaling in TiN-TiB2 nanocomposite films on Si(100): Fid-Bau Portal

Atomic force microscopy study of growth kinetics: Scaling in TiN-TiB2 nanocomposite films on Si(100)

Chu, K. / Liu, Z. J. / Lu, Y. H. / Shen, Y. G.

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Atomic force microscopy study of growth kinetics: Scaling in TiN-TiB2 nanocomposite films on Si(100)

Chu, K. / Liu, Z. J. / Lu, Y. H. / Shen, Y. G.

Atomic force microscopy study of growth kinetics: Scaling in TiN-TiB2 nanocomposite films on Si(100)

Chu, K. / Liu, Z. J. / Lu, Y. H. / Shen, Y. G.

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Check availability in my library

Order at Subito €

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Document information

Title:

Atomic force microscopy study of growth kinetics: Scaling in TiN-TiB2 nanocomposite films on Si(100)

Contributors:

Chu, K. (author) / Liu, Z. J. (author) / Lu, Y. H. (author) / Shen, Y. G. (author)

Published in:

APPLIED SURFACE SCIENCE ; 252 ; 8091-8095

Publication date:

2006-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Jing, J. / Henriksen, P. N. / Chu, H. T. et al. | British Library Online Contents | 1992

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Czerwinski, F. / Szpunar, J. A. | British Library Online Contents | 1996

An atomic force microscopy study of corona-treated polypropylene films

Overney, R. M. / Luethi, R. / Haefke, H. et al. | British Library Online Contents | 1993

Atomic Force Microscopy

Blanchard, C. R. / Campbell, J. B. | British Library Online Contents | 1995