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Variations in the Measured Carrier Lifetimes of n^- 4H-SiC Epilayers

Klein, P.B. / Caldwell, J.D. / Shrivastava, A. / Sudarshan, T.S.

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Variations in the Measured Carrier Lifetimes of n^- 4H-SiC Epilayers

Klein, P.B. / Caldwell, J.D. / Shrivastava, A. / Sudarshan, T.S.

Variations in the Measured Carrier Lifetimes of n^- 4H-SiC Epilayers

Klein, P.B. / Caldwell, J.D. / Shrivastava, A. / Sudarshan, T.S.

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Check availability in my library

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Document information

Title:

Variations in the Measured Carrier Lifetimes of n^- 4H-SiC Epilayers

Contributors:

Klein, P.B. (author) / Caldwell, J.D. (author) / Shrivastava, A. (author) / Sudarshan, T.S. (author)

Published in:

MATERIALS SCIENCE FORUM ; 600/603 ; 489-492

Publication date:

2009-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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