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    Interface characterization of high-k dielectrics on Ge substrates

    New search for: Misra, D.
    New search for: Garg, R.
    New search for: Srinivasan, P.
    New search for: Rahim, N.
    New search for: Chowdhury, N. A.

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    Interface characterization of high-k dielectrics on Ge substrates

    New search for: Misra, D.
    New search for: Garg, R.
    New search for: Srinivasan, P.
    New search for: Rahim, N.
    New search for: Chowdhury, N. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Interface characterization of high-k dielectrics on Ge substrates

    New search for: Misra, D.
    New search for: Garg, R.
    New search for: Srinivasan, P.
    New search for: Rahim, N.
    New search for: Chowdhury, N. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Interface characterization of high-k dielectrics on Ge substrates

    Contributors:

    Misra, D. (author) / Garg, R. (author) / Srinivasan, P. (author) / Rahim, N. (author) / Chowdhury, N. A. (author)

    Published in:

    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 9 ; 741-748

    Publication date:

    2006-01-01

    Size:

    8 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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