An electrostatic force microscope study of Si nanostructures on Si(100) as a function of post-annealing temperature and time: Fid-Bau Portal

An electrostatic force microscope study of Si nanostructures on Si(100) as a function of post-annealing temperature and time

Sun, H. T. / Li, Z. H. / Zhou, J. / Zhao, Y. Y. / Lu, M.

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An electrostatic force microscope study of Si nanostructures on Si(100) as a function of post-annealing temperature and time

Sun, H. T. / Li, Z. H. / Zhou, J. / Zhao, Y. Y. / Lu, M.

An electrostatic force microscope study of Si nanostructures on Si(100) as a function of post-annealing temperature and time

Sun, H. T. / Li, Z. H. / Zhou, J. / Zhao, Y. Y. / Lu, M.

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Check availability in my library

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Document information

Title:

An electrostatic force microscope study of Si nanostructures on Si(100) as a function of post-annealing temperature and time

Contributors:

Sun, H. T. (author) / Li, Z. H. (author) / Zhou, J. (author) / Zhao, Y. Y. (author) / Lu, M. (author)

Published in:

APPLIED SURFACE SCIENCE ; 253 ; 6109-6112

Publication date:

2007-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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