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Characterization of Failure Behaviors in Anisotropic Conductive Interconnection

Kim, J.-W. / Kim, D.-G. / Koo, J.-M. / Yoon, J.-W. / Choi, S. / Kim, K.-S. / Nam, J.-D. / Lee, H.-J. / Joo, J. / Jung, S.-B.

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Characterization of Failure Behaviors in Anisotropic Conductive Interconnection

Kim, J.-W. / Kim, D.-G. / Koo, J.-M. / Yoon, J.-W. / Choi, S. / Kim, K.-S. / Nam, J.-D. / Lee, H.-J. / Joo, J. / Jung, S.-B.

Characterization of Failure Behaviors in Anisotropic Conductive Interconnection

Kim, J.-W. / Kim, D.-G. / Koo, J.-M. / Yoon, J.-W. / Choi, S. / Kim, K.-S. / Nam, J.-D. / Lee, H.-J. / Joo, J. / Jung, S.-B.

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Document information

Title:

Characterization of Failure Behaviors in Anisotropic Conductive Interconnection

Contributors:

Kim, J.-W. (author) / Kim, D.-G. (author) / Koo, J.-M. (author) / Yoon, J.-W. (author) / Choi, S. (author) / Kim, K.-S. (author) / Nam, J.-D. (author) / Lee, H.-J. (author) / Joo, J. (author) / Jung, S.-B. (author)

Published in:

MATERIALS TRANSACTIONS ; 48 ; 1070-1078

Publication date:

2007-01-01

Size:

9 pages

ISSN:

1345-9678

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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