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    Effects of Incident Angle on Microstructure of Ni Thin Film Deposited by PVD

    New search for: Yingchun, S.
    New search for: Jiujun, X.
    New search for: Xiaodong, H.

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    Effects of Incident Angle on Microstructure of Ni Thin Film Deposited by PVD

    New search for: Yingchun, S.
    New search for: Jiujun, X.
    New search for: Xiaodong, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effects of Incident Angle on Microstructure of Ni Thin Film Deposited by PVD

    New search for: Yingchun, S.
    New search for: Jiujun, X.
    New search for: Xiaodong, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Effects of Incident Angle on Microstructure of Ni Thin Film Deposited by PVD

    Contributors:

    Yingchun, S. (author) / Jiujun, X. (author) / Xiaodong, H. (author)

    Published in:

    RARE METAL MATERIALS AND ENGINEERING ; 36 ; 583-586

    Publication date:

    2007-01-01

    Size:

    4 pages

    ISSN:

    1002-185X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  669

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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