Measurement of Charge Carrier Lifetime Temperature-Dependence in 4H-SiC Power Diodes

Udal, A. / Velmre, E. | British Library Online Contents | 2000

Measurement of Carrier Lifetime Temperature Dependence in 3.3kV 4H-SiC PiN Diodes Using OCVD Technique

Dheilly, N. / Planson, D. / Brosselard, P. et al. | British Library Online Contents | 2009

Temperature Dependence of the Carrier Lifetime in 4H-SiC Epilayers

Klein, P.B. / Myers-Ward, R.L. / Lew, K.K. et al. | British Library Online Contents | 2010

Lifetime Control of the Minority Carrier in PiN Diodes by He^+ Ion Implantation

Tanaka, Y. / Kojima, K. / Takao, K. et al. | British Library Online Contents | 2005

The Role of Carrier Lifetime in Forward Bias Degradation of 4H-SiC PiN Diodes

Hefner, A. / McNutt, T. / Berning, D. et al. | British Library Online Contents | 2004