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Analysis of the abnormal resistance in AlGaN/GaN heterostructure's ohmic contact tests

Xu, C. / Wang, J. / Jin, H. / Zhou, J. / Wen, C.P.

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Analysis of the abnormal resistance in AlGaN/GaN heterostructure's ohmic contact tests

Xu, C. / Wang, J. / Jin, H. / Zhou, J. / Wen, C.P.

Analysis of the abnormal resistance in AlGaN/GaN heterostructure's ohmic contact tests

Xu, C. / Wang, J. / Jin, H. / Zhou, J. / Wen, C.P.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Analysis of the abnormal resistance in AlGaN/GaN heterostructure's ohmic contact tests

Contributors:

Xu, C. (author) / Wang, J. (author) / Jin, H. (author) / Zhou, J. (author) / Wen, C.P. (author)

Published in:

RARE METALS -BEIJING- ENGLISH EDITION ; 26 ; 463-469

Publication date:

2007-01-01

Size:

7 pages

ISSN:

1001-0521

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 669

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