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Optical properties of Al-doped ZnO thin films by ellipsometry

Li, Q. H. / Zhu, D. / Liu, W. / Liu, Y. / Ma, X. C.

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Optical properties of Al-doped ZnO thin films by ellipsometry

Li, Q. H. / Zhu, D. / Liu, W. / Liu, Y. / Ma, X. C.

Optical properties of Al-doped ZnO thin films by ellipsometry

Li, Q. H. / Zhu, D. / Liu, W. / Liu, Y. / Ma, X. C.

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Order at Subito €

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Document information

Title:

Optical properties of Al-doped ZnO thin films by ellipsometry

Contributors:

Li, Q. H. (author) / Zhu, D. (author) / Liu, W. (author) / Liu, Y. (author) / Ma, X. C. (author)

Published in:

APPLIED SURFACE SCIENCE ; 254 ; 2922-2926

Publication date:

2008-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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