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    Spectroscopic ellipsometry investigations of the optical properties of manganese doped bismuth vanadate thin films

    New search for: Kumari, N.
    New search for: Krupanidhi, S. B.
    New search for: Varma, K. B.

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    Spectroscopic ellipsometry investigations of the optical properties of manganese doped bismuth vanadate thin films

    New search for: Kumari, N.
    New search for: Krupanidhi, S. B.
    New search for: Varma, K. B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroscopic ellipsometry investigations of the optical properties of manganese doped bismuth vanadate thin films

    New search for: Kumari, N.
    New search for: Krupanidhi, S. B.
    New search for: Varma, K. B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Spectroscopic ellipsometry investigations of the optical properties of manganese doped bismuth vanadate thin films

    Contributors:

    Kumari, N. (author) / Krupanidhi, S. B. (author) / Varma, K. B. (author)

    Published in:

    MATERIALS RESEARCH BULLETIN ; 45 ; 464-473

    Publication date:

    2010-01-01

    Size:

    10 pages

    ISSN:

    0025-5408

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11 / 620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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