A platform for research: civil engineering, architecture and urbanism
Scanning tunneling microscopy investigations of silicon carbide nanowires
Scanning tunneling microscopy investigations of silicon carbide nanowires
Scanning tunneling microscopy investigations of silicon carbide nanowires
Busiakiewicz, A. (author) / Klusek, Z. (author) / Huczko, A. (author) / Kowalczyk, P. J. (author) / Dabrowski, P. (author) / Kozlowski, W. (author) / Cudzilo, S. (author) / Datta, P. K. (author) / Olejniczak, W. (author)
APPLIED SURFACE SCIENCE ; 254 ; 4268-4272
2008-01-01
5 pages
Article (Journal)
English
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Springer Verlag | 1986
|Some investigations on HF-CVD diamond using scanning tunneling microscopy
British Library Online Contents | 1996
|Scanning Tunneling Optical Microscopy
Springer Verlag | 1990
|Atomic Force Microscopy/Scanning Tunneling Microscopy
TIBKAT | 1994
|