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Investigation of Ultra Thin Thermal Nitrided Gate Dielectrics in Comparison to Plasma Nitrided Gate Dielectrics for High-Performance Logic Application for 65nm
Investigation of Ultra Thin Thermal Nitrided Gate Dielectrics in Comparison to Plasma Nitrided Gate Dielectrics for High-Performance Logic Application for 65nm
Investigation of Ultra Thin Thermal Nitrided Gate Dielectrics in Comparison to Plasma Nitrided Gate Dielectrics for High-Performance Logic Application for 65nm
Trentzsch, M. (author) / Golz, C. (author) / Wieczorek, K. (author) / Stephan, R. (author) / Mantei, T. (author) / Bayha, B. (author) / Ohsiek, S. (author) / Raab, M. (author) / Nenyei, Z. (author) / Lerch, W. (author)
2008-01-01
12 pages
Article (Journal)
English
DDC:
620.11
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