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    C-V characterization of Schottky- and MIS-gate SiGe/Si HEMT structures

    New search for: Onojima, N.
    New search for: Kasamatsu, A.
    New search for: Hirose, N.
    New search for: Mimura, T.
    New search for: Matsui, T.

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    C-V characterization of Schottky- and MIS-gate SiGe/Si HEMT structures

    New search for: Onojima, N.
    New search for: Kasamatsu, A.
    New search for: Hirose, N.
    New search for: Mimura, T.
    New search for: Matsui, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    C-V characterization of Schottky- and MIS-gate SiGe/Si HEMT structures

    New search for: Onojima, N.
    New search for: Kasamatsu, A.
    New search for: Hirose, N.
    New search for: Mimura, T.
    New search for: Matsui, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    C-V characterization of Schottky- and MIS-gate SiGe/Si HEMT structures

    Contributors:

    Onojima, N. (author) / Kasamatsu, A. (author) / Hirose, N. (author) / Mimura, T. (author) / Matsui, T. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 254 ; 6162-6164

    Publication date:

    2008-01-01

    Size:

    3 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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