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    SIMS depth profile analysis of sodium in silicon dioxide

    New search for: Yamamoto, Y.
    New search for: Shimodaira, N.

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    SIMS depth profile analysis of sodium in silicon dioxide

    New search for: Yamamoto, Y.
    New search for: Shimodaira, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    SIMS depth profile analysis of sodium in silicon dioxide

    New search for: Yamamoto, Y.
    New search for: Shimodaira, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    SIMS depth profile analysis of sodium in silicon dioxide

    Contributors:

    Yamamoto, Y. (author) / Shimodaira, N. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 255 ; 860-862

    Publication date:

    2008-01-01

    Size:

    3 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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