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Shave-off vector profiling for TEM samples

Nojima, M. / Fujii, M. / Ishizaki, Y. / Owari, M. / Nihei, Y.

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Shave-off vector profiling for TEM samples

Nojima, M. / Fujii, M. / Ishizaki, Y. / Owari, M. / Nihei, Y.

Shave-off vector profiling for TEM samples

Nojima, M. / Fujii, M. / Ishizaki, Y. / Owari, M. / Nihei, Y.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

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Document information

Title:

Shave-off vector profiling for TEM samples

Contributors:

Nojima, M. (author) / Fujii, M. (author) / Ishizaki, Y. (author) / Owari, M. (author) / Nihei, Y. (author)

Published in:

APPLIED SURFACE SCIENCE ; 255 ; 1400-1403

Publication date:

2008-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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