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    Local charge neutralization using secondary electrons induced by focused electron beam in TOF-SIMS analysis

    New search for: Sakamoto, T.
    New search for: Yamaguchi, J.

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    Local charge neutralization using secondary electrons induced by focused electron beam in TOF-SIMS analysis

    New search for: Sakamoto, T.
    New search for: Yamaguchi, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Local charge neutralization using secondary electrons induced by focused electron beam in TOF-SIMS analysis

    New search for: Sakamoto, T.
    New search for: Yamaguchi, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Local charge neutralization using secondary electrons induced by focused electron beam in TOF-SIMS analysis

    Contributors:

    Sakamoto, T. (author) / Yamaguchi, J. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 255 ; 1621-1624

    Publication date:

    2008-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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