Orientation dependence of electrical properties for Bi4-xNdxTi3O12 (x=0.85) thin film deposited on p-type Si(100) substrate: Fid-Bau Portal

Orientation dependence of electrical properties for Bi4-xNdxTi3O12 (x=0.85) thin film deposited on p-type Si(100) substrate

Yi, S. W. / Kim, S. S. / Kim, W. J. / Do, D.

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Orientation dependence of electrical properties for Bi4-xNdxTi3O12 (x=0.85) thin film deposited on p-type Si(100) substrate

Yi, S. W. / Kim, S. S. / Kim, W. J. / Do, D.

Orientation dependence of electrical properties for Bi4-xNdxTi3O12 (x=0.85) thin film deposited on p-type Si(100) substrate

Yi, S. W. / Kim, S. S. / Kim, W. J. / Do, D.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Orientation dependence of electrical properties for Bi4-xNdxTi3O12 (x=0.85) thin film deposited on p-type Si(100) substrate

Contributors:

Yi, S. W. (author) / Kim, S. S. (author) / Kim, W. J. (author) / Do, D. (author)

Published in:

APPLIED SURFACE SCIENCE ; 255 ; 2710-2714

Publication date:

2008-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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