Contrast of Basal Plane and Threading Edge Dislocations in 4H-SiC by X-Ray Topography in Grazing Incidence Geometry: Fid-Bau Portal

Contrast of Basal Plane and Threading Edge Dislocations in 4H-SiC by X-Ray Topography in Grazing Incidence Geometry

Matsuhata, H. / Yamaguchi, H. / Nagai, I. / Ohno, T. / Kosugi, R. / Kinoshita, A.

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Contrast of Basal Plane and Threading Edge Dislocations in 4H-SiC by X-Ray Topography in Grazing Incidence Geometry

Matsuhata, H. / Yamaguchi, H. / Nagai, I. / Ohno, T. / Kosugi, R. / Kinoshita, A.

Contrast of Basal Plane and Threading Edge Dislocations in 4H-SiC by X-Ray Topography in Grazing Incidence Geometry

Matsuhata, H. / Yamaguchi, H. / Nagai, I. / Ohno, T. / Kosugi, R. / Kinoshita, A.

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Title:

Contrast of Basal Plane and Threading Edge Dislocations in 4H-SiC by X-Ray Topography in Grazing Incidence Geometry

Contributors:

Matsuhata, H. (author) / Yamaguchi, H. (author) / Nagai, I. (author) / Ohno, T. (author) / Kosugi, R. (author) / Kinoshita, A. (author)

Published in:

MATERIALS SCIENCE FORUM ; 600/603 ; 321-324

Publication date:

2009-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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