Trap States in Oxidation Layer of Nanocrystal Si: Fid-Bau Portal

Trap States in Oxidation Layer of Nanocrystal Si

Huang, W.-q. / Qin, C.-j. / Xu, L. / Wu, K.-y.

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Trap States in Oxidation Layer of Nanocrystal Si

Huang, W.-q. / Qin, C.-j. / Xu, L. / Wu, K.-y.

Trap States in Oxidation Layer of Nanocrystal Si

Huang, W.-q. / Qin, C.-j. / Xu, L. / Wu, K.-y.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Trap States in Oxidation Layer of Nanocrystal Si

Contributors:

Huang, W.-q. (author) / Qin, C.-j. (author) / Xu, L. (author) / Wu, K.-y. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -HANGZHOU- ; 27 ; 125-128

Publication date:

2009-01-01

Size:

4 pages

ISSN:

1673-2812

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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