Study of trap centres in silicon nanocrystal memories: Fid-Bau Portal

Study of trap centres in silicon nanocrystal memories

Souifi, A. / Brounkov, P. / Bernardini, S. / Busseret, C. / Militaru, L. / Guillot, G. / Baron, T.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Study of trap centres in silicon nanocrystal memories

Souifi, A. / Brounkov, P. / Bernardini, S. / Busseret, C. / Militaru, L. / Guillot, G. / Baron, T.

Study of trap centres in silicon nanocrystal memories

Souifi, A. / Brounkov, P. / Bernardini, S. / Busseret, C. / Militaru, L. / Guillot, G. / Baron, T.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Study of trap centres in silicon nanocrystal memories

Contributors:

Souifi, A. (author) / Brounkov, P. (author) / Bernardini, S. (author) / Busseret, C. (author) / Militaru, L. (author) / Guillot, G. (author) / Baron, T. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 99-107

Publication date:

2003-01-01

Size:

9 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Muralidhar, R. / Sadd, M. A. / White, B. E. Jr | Springer Verlag | 2009

Study on charge trap layer in nanocrystal charge trap MOSFET

Seung Su Cho, / Kyong Hee Joo, / In-Seok Yeo, et al. | IEEE | 2006

Programming options for nanocrystal MOS memories

Corso, D. / Crupi, I. / Ammendola, G. et al. | British Library Online Contents | 2003

Retention characteristics of Ge-nanocrystal nonvolatile MOS memories

Oh, J.S. / Oh, H.T. / Lee, Y.H. et al. | IEEE | 2006

Trap States in Oxidation Layer of Nanocrystal Si

Huang, W.-q. / Qin, C.-j. / Xu, L. et al. | British Library Online Contents | 2009