Minority carrier lifetime and metallic-impurity mapping in silicon wafers

Palais, O. / Martinuzzi, S. / Simon, J. J. | British Library Online Contents | 2001

Mapping of minority carrier lifetime and mobility in imperfect silicon wafers

Palais, O. / Clerc, L. / Arcari, A. et al. | British Library Online Contents | 2003

Mapping of the local minority carrier diffusion length in silicon wafers

Stemmer, M. | British Library Online Contents | 1993

Uniformity Improvement of Planetary Epitaxial Growth Processes through Analysis of Intentionally Stalled SiC Wafers

Oliver, J.D. / Ponczak, B.H. / Parikh, R.P. et al. | British Library Online Contents | 2009

Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers

Palais, O. / Yakimov, E. / Martinuzzi, S. | British Library Online Contents | 2002