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Simulations of Open Emitter Breakdown Voltage in SiC BJTs with Non Implanted JTE
Simulations of Open Emitter Breakdown Voltage in SiC BJTs with Non Implanted JTE
Simulations of Open Emitter Breakdown Voltage in SiC BJTs with Non Implanted JTE
Buono, B. (author) / Lee, H.S. (author) / Domeij, M. (author) / Zetterling, C.M. (author) / Ostling, M. (author)
MATERIALS SCIENCE FORUM ; 615/617 ; 841-844
2009-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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