A platform for research: civil engineering, architecture and urbanism
High-Efficient Damage-Free Correction of the Thickness Distribution of Quartz Crystal Wafer Using Open-Air Type Plasma CVM
High-Efficient Damage-Free Correction of the Thickness Distribution of Quartz Crystal Wafer Using Open-Air Type Plasma CVM
High-Efficient Damage-Free Correction of the Thickness Distribution of Quartz Crystal Wafer Using Open-Air Type Plasma CVM
Yamamura, K. (author) / Morikawa, T. (author) / Ueda, M. (author) / Rui, F. / Lihong, Q. / Huawei, C. / Akio, O. / Hiroshi, U. / Katsuhiko, S.
2009-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2010
|British Library Online Contents | 2000
|Characterization of Swept Synthetic High Quality Quartz Crystal
British Library Online Contents | 2015
|Analysis of a Quartz Plate Thickness-Shear Piezoelectric Gyroscope
British Library Conference Proceedings | 2000
|British Library Online Contents | 2009
|