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    Nanostructural C-Al-N thin films studied by x-ray photoelectron spectroscopy, Raman and high-resolution transmission electron microscopy

    New search for: Han, Y.F.
    New search for: Fu, T.
    New search for: Shen, Y.G.

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    Nanostructural C-Al-N thin films studied by x-ray photoelectron spectroscopy, Raman and high-resolution transmission electron microscopy

    New search for: Han, Y.F.
    New search for: Fu, T.
    New search for: Shen, Y.G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Nanostructural C-Al-N thin films studied by x-ray photoelectron spectroscopy, Raman and high-resolution transmission electron microscopy

    New search for: Han, Y.F.
    New search for: Fu, T.
    New search for: Shen, Y.G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Nanostructural C-Al-N thin films studied by x-ray photoelectron spectroscopy, Raman and high-resolution transmission electron microscopy

    Contributors:

    Han, Y.F. (author) / Fu, T. (author) / Shen, Y.G. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 24 ; 3321-3330

    Publication date:

    2009-01-01

    Size:

    10 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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