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    Improved electromigration reliability of surface acoustic wave devices using Ti/Al-Mo/Ti/Al-Mo electrodes

    New search for: Li, D.
    New search for: Liu, M.

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    Improved electromigration reliability of surface acoustic wave devices using Ti/Al-Mo/Ti/Al-Mo electrodes

    New search for: Li, D.
    New search for: Liu, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Improved electromigration reliability of surface acoustic wave devices using Ti/Al-Mo/Ti/Al-Mo electrodes

    New search for: Li, D.
    New search for: Liu, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Improved electromigration reliability of surface acoustic wave devices using Ti/Al-Mo/Ti/Al-Mo electrodes

    Contributors:

    Li, D. (author) / Liu, M. (author)

    Published in:

    RARE METALS -BEIJING- ENGLISH EDITION ; 28 ; 554-558

    Publication date:

    2009-01-01

    Size:

    5 pages

    ISSN:

    1001-0521

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  669

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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