X-ray photoelectron and X-ray absorption spectroscopic study on b-FeSi2 thin films fabricated by ion beam sputter deposition: Fid-Bau Portal

X-ray photoelectron and X-ray absorption spectroscopic study on b-FeSi2 thin films fabricated by ion beam sputter deposition

Esaka, F. / Yamamoto, H. / Matsubayashi, N. / Yamada, Y. / Sasase, M. / Yamaguchi, K. / Shamoto, S. / Magara, M. / Kimura, T.

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X-ray photoelectron and X-ray absorption spectroscopic study on b-FeSi2 thin films fabricated by ion beam sputter deposition

Esaka, F. / Yamamoto, H. / Matsubayashi, N. / Yamada, Y. / Sasase, M. / Yamaguchi, K. / Shamoto, S. / Magara, M. / Kimura, T.

X-ray photoelectron and X-ray absorption spectroscopic study on b-FeSi2 thin films fabricated by ion beam sputter deposition

Esaka, F. / Yamamoto, H. / Matsubayashi, N. / Yamada, Y. / Sasase, M. / Yamaguchi, K. / Shamoto, S. / Magara, M. / Kimura, T.

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Document information

Title:

X-ray photoelectron and X-ray absorption spectroscopic study on b-FeSi2 thin films fabricated by ion beam sputter deposition

Contributors:

Esaka, F. (author) / Yamamoto, H. (author) / Matsubayashi, N. (author) / Yamada, Y. (author) / Sasase, M. (author) / Yamaguchi, K. (author) / Shamoto, S. (author) / Magara, M. (author) / Kimura, T. (author)

Published in:

APPLIED SURFACE SCIENCE ; 256 ; 3155-3159

Publication date:

2010-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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