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Fast and slow interface traps in transparent NiO gated AlGaN/GaN heterostructure field-effect transistors
Fast and slow interface traps in transparent NiO gated AlGaN/GaN heterostructure field-effect transistors
Fast and slow interface traps in transparent NiO gated AlGaN/GaN heterostructure field-effect transistors
Li, Liuan (author) / Chen, Jia (author) / Liu, Zhenxing (author) / Que, Taotao (author) / Gu, Xin (author) / He, Liang (author) / Liu, Yang (author)
Applied surface science ; 475 ; 1043-1047
2019-01-01
5 pages
Article (Journal)
English
DDC:
620.44
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