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Crystalline Quality of Channel Regions in SiC Buried Gate Static Induction Transistors (SiC-BGSITs)
Crystalline Quality of Channel Regions in SiC Buried Gate Static Induction Transistors (SiC-BGSITs)
Crystalline Quality of Channel Regions in SiC Buried Gate Static Induction Transistors (SiC-BGSITs)
Takatsuka, A. (author) / Tanaka, Y. (author) / Yano, K. (author) / Yatsuo, T. (author) / Arai, K. (author) / Bauer, A.J. / Friedrichs, P. / Krieger, M. / Pensl, G. / Rupp, R.
2010-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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