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Performance, Reliability, and Robustness of 4H-SiC Power DMOSFETs
Performance, Reliability, and Robustness of 4H-SiC Power DMOSFETs
Performance, Reliability, and Robustness of 4H-SiC Power DMOSFETs
Ryu, S.H. (author) / Hull, B.A. (author) / Dhar, S. (author) / Cheng, L. (author) / Zhang, Q.C. (author) / Richmond, J. (author) / Das, M.K. (author) / Agarwal, A. (author) / Palmour, J. (author) / Lelis, A.J. (author)
2010-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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