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    Simulation of the creep damage behavior of thin film/substrate systems by bending creep tests

    New search for: Wen, S. F.
    New search for: Yan, W. Z.
    New search for: Kang, J. X.
    New search for: Liu, J.
    New search for: Yue, Z. F.

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    Simulation of the creep damage behavior of thin film/substrate systems by bending creep tests

    New search for: Wen, S. F.
    New search for: Yan, W. Z.
    New search for: Kang, J. X.
    New search for: Liu, J.
    New search for: Yue, Z. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Simulation of the creep damage behavior of thin film/substrate systems by bending creep tests

    New search for: Wen, S. F.
    New search for: Yan, W. Z.
    New search for: Kang, J. X.
    New search for: Liu, J.
    New search for: Yue, Z. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Simulation of the creep damage behavior of thin film/substrate systems by bending creep tests

    Contributors:

    Wen, S. F. (author) / Yan, W. Z. (author) / Kang, J. X. (author) / Liu, J. (author) / Yue, Z. F. (author)

    Published in:

    MATERIALS AND DESIGN -REIGATE- ; 31 ; 3531-3536

    Publication date:

    2010-01-01

    Size:

    6 pages

    ISSN:

    0264-1275

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.0042

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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