Simulation of the interface characterization of thin film on substrate system by bending creep tests: Fid-Bau Portal

Simulation of the interface characterization of thin film on substrate system by bending creep tests

Wen, S. F. / Yan, W. Z. / Kang, J. X. / Liu, J. / Yue, Z. F.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Simulation of the interface characterization of thin film on substrate system by bending creep tests

Wen, S. F. / Yan, W. Z. / Kang, J. X. / Liu, J. / Yue, Z. F.

Simulation of the interface characterization of thin film on substrate system by bending creep tests

Wen, S. F. / Yan, W. Z. / Kang, J. X. / Liu, J. / Yue, Z. F.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Simulation of the interface characterization of thin film on substrate system by bending creep tests

Contributors:

Wen, S. F. (author) / Yan, W. Z. (author) / Kang, J. X. (author) / Liu, J. (author) / Yue, Z. F. (author)

Published in:

APPLIED SURFACE SCIENCE ; 257 ; 1289-1294

Publication date:

2010-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Wen, S. F. / Yan, W. Z. / Kang, J. X. et al. | British Library Online Contents | 2010

Investigation of creep stress characterization of thin film/substrate systems with indentation method

Xu, B. X. / Wang, X. M. / Zhao, B. et al. | British Library Online Contents | 2007

A sectional approach for the bending creep of FRC based on uniaxial tension creep tests

Vrijdaghs, R. / Prisco, M. Di / Vandewalle, L. | TIBKAT | 2020

A sectional approach for the bending creep of FRC based on uniaxial tension creep tests

Vrijdaghs, R. / Prisco, M. Di / Vandewalle, L. | TIBKAT | 2021

The calculation of the relaxed creep strain in four-point bending tests

Snowden, K. U. / Mehrtens, E. G. | British Library Online Contents | 1997