Long time stability of ITO/NiPc/ZnO/Al devices with ZnO buffer layer formed by atomic layer deposition technique-impedance spectroscopy analysis: Fid-Bau Portal

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Long time stability of ITO/NiPc/ZnO/Al devices with ZnO buffer layer formed by atomic layer deposition technique-impedance spectroscopy analysis

Stakhira, P. Y. / Grygorchak, I. I. / Cherpak, V. V. / Ivastchyshyn, F. O. / Volynyuk, D. Y. / Luka, G. / Godlewski, M. / Guziewicz, E. / Pakhomov, G. L. / Hotra, Z. Y.

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Long time stability of ITO/NiPc/ZnO/Al devices with ZnO buffer layer formed by atomic layer deposition technique-impedance spectroscopy analysis

Stakhira, P. Y. / Grygorchak, I. I. / Cherpak, V. V. / Ivastchyshyn, F. O. / Volynyuk, D. Y. / Luka, G. / Godlewski, M. / Guziewicz, E. / Pakhomov, G. L. / Hotra, Z. Y.

Long time stability of ITO/NiPc/ZnO/Al devices with ZnO buffer layer formed by atomic layer deposition technique-impedance spectroscopy analysis

Stakhira, P. Y. / Grygorchak, I. I. / Cherpak, V. V. / Ivastchyshyn, F. O. / Volynyuk, D. Y. / Luka, G. / Godlewski, M. / Guziewicz, E. / Pakhomov, G. L. / Hotra, Z. Y.

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Title:

Long time stability of ITO/NiPc/ZnO/Al devices with ZnO buffer layer formed by atomic layer deposition technique-impedance spectroscopy analysis

Contributors:

Stakhira, P. Y. (author) / Grygorchak, I. I. (author) / Cherpak, V. V. (author) / Ivastchyshyn, F. O. (author) / Volynyuk, D. Y. (author) / Luka, G. (author) / Godlewski, M. (author) / Guziewicz, E. (author) / Pakhomov, G. L. (author) / Hotra, Z. Y. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B ADVANCED FUNCTIONAL SOLID STATE MATERIALS ; 172 ; 272-275

Publication date:

2010-01-01

Size:

4 pages

ISSN:

Type of media:

Article (Journal)

Type of material:

Print

Language:

English

Classification:

© Metadata Copyright the British Library Board and other contributors. All rights reserved.

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