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Determining the Complete Residual Stress Tensors in SOS Hetero-Epitaxial Thin Film Systems by the Technique of X-Ray Diffraction
Determining the Complete Residual Stress Tensors in SOS Hetero-Epitaxial Thin Film Systems by the Technique of X-Ray Diffraction
Determining the Complete Residual Stress Tensors in SOS Hetero-Epitaxial Thin Film Systems by the Technique of X-Ray Diffraction
Liu, M. (author) / Zhang, L.C. (author) / Brawley, A. (author) / Atanackovic, P. (author) / Duvall, S. (author) / Wang, J. / Mathew, P. / Li, X. / Huang, C. / Zhu, H.
2010-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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