TOF-SIMS depth profiling of SIMON: Fid-Bau Portal

TOF-SIMS depth profiling of SIMON

Xin, G. / Dong, G. / Xu, C. / Liangzhen, C. / Brox, O. / Benninghoven, A.

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TOF-SIMS depth profiling of SIMON

Xin, G. / Dong, G. / Xu, C. / Liangzhen, C. / Brox, O. / Benninghoven, A.

TOF-SIMS depth profiling of SIMON

Xin, G. / Dong, G. / Xu, C. / Liangzhen, C. / Brox, O. / Benninghoven, A.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

TOF-SIMS depth profiling of SIMON

Contributors:

Xin, G. (author) / Dong, G. (author) / Xu, C. (author) / Liangzhen, C. (author) / Brox, O. (author) / Benninghoven, A. (author)

Published in:

APPLIED SURFACE SCIENCE ; 203-204 ; 441-444

Publication date:

2003-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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