Revealing Buried Interfaces to Understand the Origins of Threshold Voltage Shifts in Organic Field Effect Transistors: Fid-Bau Portal

Revealing Buried Interfaces to Understand the Origins of Threshold Voltage Shifts in Organic Field Effect Transistors

Mathijssen, S. G. / Spijkman, M. J. / Andringa, A. M. / van Hal, P. A. / McCulloch, I. / Kemerink, M. / Janssen, R. A. / de Leeuw, D. M.

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Revealing Buried Interfaces to Understand the Origins of Threshold Voltage Shifts in Organic Field Effect Transistors

Mathijssen, S. G. / Spijkman, M. J. / Andringa, A. M. / van Hal, P. A. / McCulloch, I. / Kemerink, M. / Janssen, R. A. / de Leeuw, D. M.

Revealing Buried Interfaces to Understand the Origins of Threshold Voltage Shifts in Organic Field Effect Transistors

Mathijssen, S. G. / Spijkman, M. J. / Andringa, A. M. / van Hal, P. A. / McCulloch, I. / Kemerink, M. / Janssen, R. A. / de Leeuw, D. M.

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Document information

Title:

Revealing Buried Interfaces to Understand the Origins of Threshold Voltage Shifts in Organic Field Effect Transistors

Contributors:

Mathijssen, S. G. (author) / Spijkman, M. J. (author) / Andringa, A. M. (author) / van Hal, P. A. (author) / McCulloch, I. (author) / Kemerink, M. (author) / Janssen, R. A. (author) / de Leeuw, D. M. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 22 ; 5105-5109

Publication date:

2010-01-01

Size:

5 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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