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    Probing buried interfaces on Ge-based metal gate/high-k stacks by hard X-ray photoelectron spectroscopy

    New search for: Rubio-Zuazo, J.
    New search for: Martinez, E.
    New search for: Batude, P.
    New search for: Clavelier, L.
    New search for: Chabli, A.
    New search for: Castro, G. R.

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    Probing buried interfaces on Ge-based metal gate/high-k stacks by hard X-ray photoelectron spectroscopy

    New search for: Rubio-Zuazo, J.
    New search for: Martinez, E.
    New search for: Batude, P.
    New search for: Clavelier, L.
    New search for: Chabli, A.
    New search for: Castro, G. R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Probing buried interfaces on Ge-based metal gate/high-k stacks by hard X-ray photoelectron spectroscopy

    New search for: Rubio-Zuazo, J.
    New search for: Martinez, E.
    New search for: Batude, P.
    New search for: Clavelier, L.
    New search for: Chabli, A.
    New search for: Castro, G. R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Probing buried interfaces on Ge-based metal gate/high-k stacks by hard X-ray photoelectron spectroscopy

    Contributors:

    Rubio-Zuazo, J. (author) / Martinez, E. (author) / Batude, P. (author) / Clavelier, L. (author) / Chabli, A. (author) / Castro, G. R. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 257 ; 3007-3013

    Publication date:

    2011-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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