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An optical microscopy study of dislocations in multicrystalline silicon grown by directional solidification method

Chen, N. / Qiu, S. / Liu, B. / Du, G. / Liu, G. / Sun, W.

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An optical microscopy study of dislocations in multicrystalline silicon grown by directional solidification method

Chen, N. / Qiu, S. / Liu, B. / Du, G. / Liu, G. / Sun, W.

An optical microscopy study of dislocations in multicrystalline silicon grown by directional solidification method

Chen, N. / Qiu, S. / Liu, B. / Du, G. / Liu, G. / Sun, W.

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Check availability in my library

Order at Subito €

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Document information

Title:

An optical microscopy study of dislocations in multicrystalline silicon grown by directional solidification method

Contributors:

Chen, N. (author) / Qiu, S. (author) / Liu, B. (author) / Du, G. (author) / Liu, G. (author) / Sun, W. (author)

Published in:

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 13 ; 276-280

Publication date:

2010-01-01

Size:

5 pages

ISSN:

1369-8001

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.38152

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